X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth Academic Article uri icon

authors

  • Barnett, SJ
  • Whitehouse, CR
  • Keir, AM
  • Clark, GF
  • Usher, B
  • Tanner, BK
  • Emeny, MT
  • Johnson, AD

publication date

  • April 14, 1993