Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy Academic Article uri icon

authors

  • Russell-Harriott, JJ
  • Moon, AR
  • Zou, J
  • Cockayne, DJH
  • Usher, BF

publication date

  • January 1, 1999