Probing long- and short-range disorder in Y₂Ti₂-ₓHfₓO₇ by diffraction and spectroscopy techniques Academic Article uri icon

authors

  • Zhang, Z
  • Avdeev, M
  • De Los Reyes, M
  • Lumpkin, GR
  • Kennedy, BJ
  • Blanchard, PER
  • Liu, S
  • Tadich, Anton
  • Cowie, BCC

publication date

  • 2016