Hard x-ray nanobeam characterization by coherent diffraction microscopy Academic Article uri icon

authors

  • Schropp, A
  • Boye, P
  • Feldkamp, JM
  • Hoppe, R
  • Patommel, J
  • Samberg, D
  • Stephan, S
  • Giewekemeyer, K
  • Wilke, RN
  • Salditt, T
  • Gulden, J
  • Mancuso, AP
  • Vartanyants, IA
  • Weckert, E
  • Schöder, S
  • Burghammer, M
  • Schroer, CG

publication date

  • March 2010