Monitoring fluctuations at a synchrotron beamline using matched ion chambers: 2. isolation of component noise sources, and application to attenuation measurements showing increased precision by two orders of magnitude Academic Article uri icon

authors

  • Chantler, CT
  • Tran, CQ
  • Paterson, D
  • Cookson, DJ
  • Barnea, Z

publication date

  • November 2000