Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy Academic Article uri icon

abstract

  • We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results--including losses associated with the metal coating--which can then be used as design rules.

publication date

  • September 1, 2006