Formation of misfit dislocations in strained-layer GaAs/In[sub x]Ga[sub 1−x]As/GaAs heterostructures during postfabrication thermal processing Academic Article uri icon

authors

  • Liu, XW
  • Hopgood, AA
  • Usher, BF
  • Wang, H
  • Braithwaite, N St J

publication date

  • 2003